Several advanced techniques are employed for nanoscale analysis, including:
Scanning Electron Microscopy (SEM) SEM provides high-resolution images by scanning a focused electron beam over a sample surface. It is widely used to analyze surface topography and composition.
Transmission Electron Microscopy (TEM) TEM offers detailed images of the internal structure of materials by transmitting electrons through a thin sample. It is crucial for studying the crystallographic and morphological features of nanomaterials.
Atomic Force Microscopy (AFM) AFM uses a cantilever with a sharp tip to scan the sample's surface at the atomic level. It can measure surface roughness, mechanical properties, and other surface characteristics.
X-ray Diffraction (XRD) XRD is utilized to determine the crystallographic structure of materials. It provides information on phase composition, lattice parameters, and crystallite sizes.
Raman Spectroscopy Raman Spectroscopy is a spectroscopic technique that offers insights into the vibrational modes of molecules, helping to identify chemical composition and molecular interactions.
