Kelvin Probe Force Microscopy (KPFM) is a powerful [scanning probe technique]() that measures the local surface potential of a sample at the nanoscale. It is a variation of [Atomic Force Microscopy (AFM)]() that provides high-resolution imaging of surface electric properties. By detecting the contact potential difference (CPD) between a conductive tip and the sample surface, KPFM can map work function variations, which are critical in understanding material properties at the nanoscale.
