How do Interface Traps Affect Nanoelectronic Devices?
Interface traps can lead to several detrimental effects in nanoelectronic devices such as: - Threshold Voltage Shift: In MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors), interface traps can capture charge carriers, shifting the threshold voltage and affecting the device's switching characteristics. - Increased Leakage Current: Trapping and de-trapping of carriers can increase leakage current, leading to higher power consumption and reduced efficiency. - Degraded Mobility: Traps can scatter carriers, reducing their mobility and thus the current drive capability of the device.
