Several advanced techniques are employed for direct measurement in nanotechnology:
1. Atomic Force Microscopy (AFM): It uses a cantilever with a sharp tip to scan the surface of a sample at the nanoscale. AFM provides high-resolution images and can measure forces at the atomic level. 2. Scanning Tunneling Microscopy (STM): STM allows for the imaging and manipulation of individual atoms by using a sharp conducting tip. 3. Transmission Electron Microscopy (TEM): TEM uses electron beams to produce high-resolution images of nanomaterials. It can provide detailed information about the internal structure of nanoparticles. 4. Scanning Electron Microscopy (SEM): SEM uses focused electron beams to produce detailed images of the surface morphology of nanomaterials. 5. X-Ray Diffraction (XRD): XRD is used to determine the crystallographic structure of nanomaterials by measuring the diffraction patterns of X-rays scattered by the material.
