nano scale measurements

What Methods are Used for Nanoscale Measurement?

Several advanced techniques are employed to measure and visualize nanoscale structures. Some of the most commonly used methods include:

Atomic Force Microscopy (AFM): Utilizes a mechanical probe to scan the surface of a sample, producing high-resolution images.
Scanning Electron Microscopy (SEM): Uses focused beams of electrons to generate detailed images of nanoscale structures.
Transmission Electron Microscopy (TEM): Passes electrons through a sample to create highly magnified images.
X-ray Diffraction (XRD): Helps in determining the crystalline structure of materials at the nanoscale.
Dynamic Light Scattering (DLS): Measures the size distribution of small particles in suspension or polymers in solution.

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