Measuring at the nanoscale poses several challenges, including:
Resolution Limits: Traditional optical microscopes cannot resolve structures smaller than the wavelength of visible light (~400-700 nm). Advanced techniques like AFM and TEM overcome this limitation but require specialized equipment and expertise. Sample Preparation: Nanoscale measurements often require intricate sample preparations, which can introduce artifacts or alter the sample's natural state. Environmental Sensitivity: Nanoscale measurements can be highly sensitive to environmental factors such as temperature, humidity, and vibrations, necessitating controlled conditions. Interpretation of Data: The interpretation of nanoscale data can be complex, requiring a deep understanding of both the measurement techniques and the material properties.
