atomic force microscope (afm) tip

What is an Atomic Force Microscope (AFM) Tip?

An Atomic Force Microscope (AFM) tip is a crucial component of an AFM, which is a high-resolution type of scanning probe microscope. The AFM tip is a sharp probe that interacts with the sample surface at the nanoscale level. It is typically made of silicon or silicon nitride and is mounted on a cantilever. The tip is responsible for raster scanning the surface to generate topographical maps of the sample with atomic resolution.

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