Even though modern microscopic techniques provide high resolution, they still face limitations. For example, the resolution limit of SEM is typically around 1 nanometer, whereas TEM can achieve sub-nanometer resolution. However, resolution can be affected by factors such as electron beam damage, sample preparation techniques, and instrument stability. AFM resolution is influenced by tip sharpness and the interaction between the tip and the sample, often making it less precise than electron microscopes for some applications.
