Sample preparation is a critical aspect that can introduce limitations in nanotechnology instruments. For SEM and TEM, samples often need to be thin enough for electrons to pass through, which can be challenging for certain materials. Moreover, the preparation process can introduce artifacts or damage to the sample, leading to inaccurate data. AFM and STM also require samples to be prepared in specific ways to ensure adequate interaction with the probing tip, which can sometimes be a limiting factor.
