What are the limitations due to data interpretation?
Interpreting data from nanotechnology instruments can be complex and is often subject to various assumptions and approximations. For instance, the contrast in electron microscopy images can be influenced by multiple factors such as atomic number, density, and thickness, making it challenging to extract precise information about the sample. Similarly, AFM data interpretation can be complicated by the interaction forces between the tip and the sample, which are not always straightforward to analyze.
