Several advanced techniques are employed for effective monitoring in nanotechnology:
1. Microscopy: Techniques like Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) allow for high-resolution imaging of nanomaterials. 2. Spectroscopy: Methods such as Raman Spectroscopy and X-ray Photoelectron Spectroscopy (XPS) are used to analyze the composition and chemical states of nanomaterials. 3. Dynamic Light Scattering (DLS): This technique measures the size distribution of nanoparticles in a solution. 4. Atomic Force Microscopy (AFM): AFM provides topographical information at the nanoscale. 5. Zeta Potential Analysis: Used to measure the surface charge of nanoparticles which can influence stability and aggregation.
