Nanotechnology has enabled the development of advanced techniques for detecting and measuring particulate matter. Some common methods include:
Dynamic Light Scattering (DLS): This technique measures the size distribution of small particles in suspension by analyzing the scattering of light. Electron Microscopy: Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) provide high-resolution images of nanoparticles, helping in size and shape analysis. Atomic Force Microscopy (AFM): AFM is used to measure the surface topography of nanoparticles at the atomic level. Spectroscopy: Techniques like Raman spectroscopy and X-ray Photoelectron Spectroscopy (XPS) are used to study the chemical composition of nanoparticles.
