Each imaging technique offers unique advantages and has specific limitations:
SEM
Advantages: High depth of field, easy sample preparation, and excellent surface imaging.
Limitations: Limited to surface imaging, and typically requires conductive samples.
TEM
Advantages: High resolution, detailed internal structure imaging, and diffraction capabilities.
Limitations: Requires very thin samples, complex sample preparation, and can be destructive.
AFM
Advantages: Can image non-conductive samples, provides topographical and mechanical data, and operates in various environments.
Limitations: Limited scan size, relatively slow imaging speed, and potential tip-sample interaction artifacts.
STM
Advantages: Atomic-level resolution, ability to manipulate individual atoms, and can image conductive surfaces.
Limitations: Requires ultra-high vacuum or inert atmosphere, and limited to conductive or semi-conductive samples.
