Several imaging techniques are commonly used in nanotechnology, including:
Scanning Electron Microscopy (SEM) SEM uses a focused beam of electrons to generate high-resolution images of a sample's surface. It is widely used for studying the morphology and composition of nanomaterials.
Transmission Electron Microscopy (TEM) TEM involves transmitting electrons through a thin sample to form an image. It provides detailed information on the internal structure and crystalline arrangements of nanomaterials.
Atomic Force Microscopy (AFM) AFM uses a cantilever with a sharp tip to scan the surface of a sample at the nanoscale. It is particularly useful for measuring surface topography and mechanical properties.
Scanning Tunneling Microscopy (STM) STM operates based on the tunneling current between a conductive tip and the sample surface. It allows for atomic-level resolution imaging and manipulation of individual atoms.
