Scanning Electron Microscopy (SEM)
SEM uses a focused beam of electrons to generate high-resolution images of a sample's surface. It is widely used for studying the
morphology and composition of nanomaterials.
Transmission Electron Microscopy (TEM)
TEM involves transmitting electrons through a thin sample to form an image. It provides detailed information on the internal structure and
crystalline arrangements of nanomaterials.
Atomic Force Microscopy (AFM)
AFM uses a cantilever with a sharp tip to scan the surface of a sample at the nanoscale. It is particularly useful for measuring surface topography and mechanical properties.
Scanning Tunneling Microscopy (STM)
STM operates based on the tunneling current between a conductive tip and the sample surface. It allows for atomic-level resolution imaging and manipulation of individual atoms.
SEM
Advantages: High depth of field, easy sample preparation, and excellent surface imaging.
Limitations: Limited to surface imaging, and typically requires conductive samples.
TEM
Advantages: High resolution, detailed internal structure imaging, and diffraction capabilities.
Limitations: Requires very thin samples, complex sample preparation, and can be destructive.
AFM
Advantages: Can image non-conductive samples, provides topographical and mechanical data, and operates in various environments.
Limitations: Limited scan size, relatively slow imaging speed, and potential tip-sample interaction artifacts.
STM
Advantages: Atomic-level resolution, ability to manipulate individual atoms, and can image conductive surfaces.
Limitations: Requires ultra-high vacuum or inert atmosphere, and limited to conductive or semi-conductive samples.
