Achieving nanometer scale accuracy involves several sophisticated techniques and tools. Some of the key methods include:
Atomic Force Microscopy (AFM): This technique uses a cantilever with a sharp tip to scan the surface of a sample, providing high-resolution images and measurements. Scanning Tunneling Microscopy (STM): STM allows for imaging and manipulation of atoms on surfaces by scanning a sharp tip very close to the sample. Electron Beam Lithography (EBL): EBL uses focused beams of electrons to create extremely fine patterns on substrates, essential for fabricating nanoscale devices. Nanoimprint Lithography (NIL): This technique involves pressing a nanostructured mold into a material to create nanoscale patterns with high precision.
