The most common tool used for circuit edit is the Focused Ion Beam (FIB). This instrument directs a finely focused beam of ions (usually gallium) onto the IC surface to mill or deposit material with nanometer precision. By using FIB, engineers can cut traces, sever connections, and even deposit new conductive paths. Additionally, scanning electron microscopes (SEMs) can be used in conjunction with FIB for visualizing and navigating the IC during the edit process.
