How do Focused Ion Beam (FIB) systems contribute to Nanotechnology?
Focused Ion Beam (FIB) systems are powerful tools for nanoscale fabrication and analysis. FIB uses a focused beam of ions to mill, deposit, or image materials with high precision. It is often used for site-specific analysis, cross-sectional imaging, and the preparation of samples for TEM. FIB systems are invaluable for the development and testing of nanoscale devices and structures.
