What role does Atomic Force Microscopy (AFM) play in Nanotechnology?
Atomic Force Microscopy (AFM) is a versatile tool that can image, measure, and manipulate materials at the nanoscale. It operates by scanning a cantilever with a sharp tip over the sample surface. The interaction forces between the tip and the sample cause the cantilever to deflect, which is measured using a laser beam reflected off the top of the cantilever. AFM can work in different modes, including contact, non-contact, and tapping mode, to provide detailed topographical maps of surfaces, and it is widely used in materials science, biology, and electronics.
