ImageJ can be used to analyze nanomaterials through several methods:
Particle Analysis: ImageJ can be used to detect and measure nanoparticles in an image, providing data on size distribution and particle count. Surface Roughness: For AFM images, ImageJ can compute surface roughness parameters, essential for material characterization. Layer Thickness: In SEM and TEM images, ImageJ can be used to measure the thickness of thin films and layers at the nanoscale. 3D Reconstruction: By stacking multiple 2D images, ImageJ can create 3D models of nanostructures, enabling better visualization and analysis.
