How are Boundaries, Defects, and Interfaces Characterized?
There are several techniques to characterize boundaries, defects, and interfaces in nanomaterials. Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are commonly used to visualize these features at high resolutions. Additionally, techniques like X-ray diffraction (XRD) and Atomic Force Microscopy (AFM) provide information about the structural and surface characteristics. These characterization methods are essential for understanding how boundaries, defects, and interfaces affect the properties of nanomaterials.
