Why is Indirect Measurement Important in Nanotechnology?
The significance of indirect measurement in nanotechnology cannot be overstated. Direct measurement techniques like Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) offer high-resolution images but are limited by factors such as sample preparation and measurement artifacts. Indirect measurement techniques provide a complementary approach, enabling researchers to derive essential properties such as size, shape, and chemical composition indirectly.
