Several sophisticated techniques are employed for in situ analysis in nanotechnology:
- Transmission Electron Microscopy (TEM): Enables high-resolution imaging of nanomaterials while they are subjected to different environmental conditions. - Scanning Electron Microscopy (SEM): Used for surface imaging and analysis under variable pressures and temperatures. - X-ray Diffraction (XRD): Assesses the crystalline structure of nanomaterials during synthesis or operational phases. - Raman Spectroscopy: Provides information about molecular vibrations, which can be used to infer the chemical composition and changes during various processes. - Atomic Force Microscopy (AFM): Offers high-resolution surface topography and mechanical property measurements in liquid environments or under different gases.
