Several types of microscopes are commonly used in nanotechnology, each with its unique capabilities and applications:
1. Scanning Electron Microscope (SEM): SEMs use a beam of electrons to create highly detailed images of surfaces. They are particularly useful for examining the morphology and topography of nanostructures.
2. Transmission Electron Microscope (TEM): TEMs also use electrons but allow for the observation of internal structures at very high resolutions. This makes them ideal for studying the internal composition of nanomaterials.
3. Atomic Force Microscope (AFM): AFMs measure the forces between a sharp probe and the sample surface to generate images. They can provide 3D surface profiles and are excellent for examining the mechanical properties of nanomaterials.
4. Scanning Tunneling Microscope (STM): STMs use the tunneling current between a sharp tip and the sample to produce images. They are capable of atomic-level resolution and are used to study the electronic properties of nanomaterials.
