What Is the Role of Atomic Force Microscopy (AFM) in Nanotechnology?
AFM provides three-dimensional surface profiles by scanning a sharp tip over a sample's surface. The forces between the tip and the sample are measured to generate an image. Unlike SEM, AFM does not require a vacuum environment and can be used to study samples in air or liquid. AFM is crucial for measuring nanoscale surface roughness, mechanical properties, and even electrical or magnetic properties at the nanoscale.
