How Do Microscopy and Characterization Techniques Complement Each Other?
Microscopy and characterization techniques are complementary tools in nanotechnology research. Microscopy provides detailed images and surface information, while characterization techniques offer quantitative data on the material's properties. For example, TEM can reveal the internal structure of a nanoparticle, and XRD can provide information on its crystal phase. Together, these techniques offer a comprehensive understanding of nanomaterials, enabling precise control over their synthesis and application.
