Several types of microscopy are employed in nanotechnology:
1. Scanning Electron Microscopy (SEM): SEM provides high-resolution images by scanning a focused beam of electrons across the surface of a sample. It is widely used for examining the topography and composition of nanostructures. 2. Transmission Electron Microscopy (TEM): TEM offers even higher resolution by transmitting electrons through a thin sample. It is ideal for studying the internal structure and morphology of nanomaterials. 3. Atomic Force Microscopy (AFM): AFM uses a cantilever with a sharp tip to scan the surface of a sample. It provides three-dimensional surface profiles and can measure various properties such as mechanical, electrical, and magnetic characteristics. 4. Scanning Tunneling Microscopy (STM): STM allows for atomic-scale imaging by measuring the tunneling current between a sharp tip and the sample surface. It is particularly useful for studying the electronic properties of materials.
