Analyzing nanoscale samples requires sophisticated instruments capable of resolving structures at the nanometer level. Some of the key tools include:
Scanning Electron Microscopy (SEM): Provides high-resolution images by scanning a focused beam of electrons across the sample. Transmission Electron Microscopy (TEM): Offers even higher resolution by transmitting electrons through an ultra-thin sample. Atomic Force Microscopy (AFM): Uses a cantilever with a sharp tip to scan the surface of the sample, measuring forces to create detailed topographical maps. X-ray Diffraction (XRD): Used to determine the crystal structure of nanoscale materials.
