Several sophisticated tools are used in nanotechnology metrology: - Atomic Force Microscopy (AFM): Provides high-resolution 3D images of surfaces at the nanoscale. - Scanning Electron Microscopy (SEM): Offers high-resolution images and is used for analyzing surface topography. - Transmission Electron Microscopy (TEM): Used for analyzing the internal structure of nanomaterials. - X-ray Diffraction (XRD): Helps in determining the crystalline structure of nanomaterials.
