What are the Challenges in Nanotechnology Metrology?
Nanotechnology metrology faces several challenges: - Resolution: Achieving the necessary resolution to measure features that are just a few nanometers wide. - Precision and Accuracy: Ensuring measurements are both precise and accurate at such a tiny scale. - Environmental Factors: Controlling external factors like temperature, humidity, and vibration that can affect measurements. - Instrumentation: Developing and maintaining advanced instruments like Scanning Electron Microscopes (SEM) and Atomic Force Microscopes (AFM).
