What Technologies are Used in Automated Inspection Systems for Nanotechnology?
Several advanced technologies are employed in automated inspection systems for nanotechnology, including:
1. Scanning Electron Microscopy (SEM): Provides high-resolution images to inspect surface morphology and structure. 2. Atomic Force Microscopy (AFM): Measures the topography at the nanoscale with high precision. 3. X-ray Diffraction (XRD): Analyzes the crystallographic structure of nanomaterials. 4. Spectroscopy: Techniques like Raman and FTIR spectroscopy help in identifying chemical compositions. 5. Machine Learning: Algorithms analyze vast amounts of data to identify patterns and defects that may not be visible to the human eye.
