What are the Challenges Faced by Automated Inspection Systems in Nanotechnology?
Despite their advantages, automated inspection systems in nanotechnology face several challenges:
- Resolution Limitations: Achieving the necessary resolution to inspect nanomaterials can be technically challenging and costly. - Complexity of Nanostructures: The intricate nature of nanostructures requires sophisticated algorithms and imaging techniques. - Integration with Production Lines: Seamlessly integrating these systems into existing production lines can be difficult. - Data Management: Handling and processing the vast amount of data generated by these systems require robust data management solutions.