Several advanced techniques have been developed to achieve subwavelength imaging, including:
Near-field Scanning Optical Microscopy (NSOM): Utilizes a sharp tip to scan the surface of a sample, collecting information from a region much smaller than the wavelength of light. Scanning Electron Microscopy (SEM): Uses electron beams instead of light, which have much shorter wavelengths, to achieve higher resolution imaging. Transmission Electron Microscopy (TEM): Provides atomic-level resolution by transmitting electrons through a very thin sample. Super-Resolution Microscopy: Techniques like STED, PALM, and STORM break the diffraction limit using various innovative approaches to visualize structures at the nanoscale.
