What Techniques are Used to Measure Nano Topography?
Several advanced techniques are employed to measure nano topography, including:
1. Atomic Force Microscopy (AFM): This technique uses a cantilever with a sharp tip to scan the surface of a sample, providing high-resolution topographical maps. 2. Scanning Electron Microscopy (SEM): SEM uses focused beams of electrons to create detailed surface images. 3. Transmission Electron Microscopy (TEM): TEM provides information on the internal structure as well as the surface. 4. Scanning Tunneling Microscopy (STM): STM measures the quantum tunneling current between a conductive tip and the sample to map the surface at atomic resolution.
