Several advanced techniques are employed for texture analysis at the nanoscale:
Atomic Force Microscopy (AFM): This technique provides high-resolution images and measures the force between a sharp probe and the sample surface. Scanning Electron Microscopy (SEM): SEM offers detailed images of the surface topography by scanning it with a focused beam of electrons. Transmission Electron Microscopy (TEM): TEM allows for the observation of internal structures at atomic resolution. X-ray Diffraction (XRD): XRD is used for identifying the crystallographic texture of materials. Surface Profilometry: This technique measures surface roughness and texture by scanning the surface with a stylus.
