What Techniques are Used for Measuring Nanoscale Dimensions?
Several advanced techniques are employed to measure nanoscale dimensions, each with its own set of advantages and limitations. Some of the most commonly used techniques include:
Atomic Force Microscopy (AFM): Utilizes a sharp tip to scan the surface of a sample, providing high-resolution topographical images. Scanning Electron Microscopy (SEM): Uses focused electron beams to produce detailed images of the sample's surface. Transmission Electron Microscopy (TEM): Transmits electrons through a sample to obtain high-resolution images of its internal structure. X-ray Diffraction (XRD): Analyzes the crystalline structure of materials by measuring the diffraction patterns of X-rays. Dynamic Light Scattering (DLS): Measures the size distribution of nanoparticles in a solution based on the scattering of light.
