What Are the Limitations of Scanning Electron Microscopy?
Scanning Electron Microscopy (SEM) offers detailed images of surfaces, but it has several limitations. SEM requires samples to be conductive or coated with a conductive material, which can be problematic for non-conductive samples. Additionally, the high-energy electron beam can damage delicate samples, and the technique generally provides lower resolution compared to Transmission Electron Microscopy (TEM).
