SNSF offers a broad spectrum of resources, including state-of-the-art characterization tools, fabrication equipment, and patterning technologies. Key resources include:
1. Electron Microscopy: Advanced microscopes for high-resolution imaging. 2. X-ray Diffraction: Tools for analyzing crystal structures. 3. Cleanroom Facilities: Environments for fabricating nanoscale devices. 4. Surface Analysis: Techniques such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).
