Various techniques are employed to measure depth penetration in nanotechnology. Some common methods include:
Atomic Force Microscopy (AFM): This technique uses a mechanical probe to scan the surface of a sample to measure its topography and depth. Scanning Electron Microscopy (SEM): SEM provides high-resolution images of the sample surface and can be used to measure depth penetration. X-ray Photoelectron Spectroscopy (XPS): XPS is used to analyze the surface chemistry of a material and can provide information on the depth of penetration of nanoparticles. Transmission Electron Microscopy (TEM): TEM offers detailed images of the internal structure of nanoparticles and their penetration depth within a material.
