Time-resolved XRR can provide valuable information on several key aspects of nanomaterials, including: - Thickness evolution: Monitoring how the thickness of a thin film changes during deposition or etching processes. - Interface roughness: Observing the development of roughness at the interfaces between different layers. - Density fluctuations: Tracking changes in the density of materials, which can indicate phase transitions or chemical reactions. - Layer composition: Identifying how the composition of different layers evolves over time.
