The Scanning Tunneling Microscope (STM) is a revolutionary instrument that was invented in 1981 by Gerd Binnig and Heinrich Rohrer at IBM Zurich. This breakthrough technology allows scientists to visualize surfaces at the atomic level, a capability that was previously unattainable. The STM operates by scanning a sharp metal probe very close to the surface of a conductive sample, enabling the detection of electrical currents that tunnel between the probe and the sample.
