What is Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)?
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) is a powerful analytical technique that combines the capabilities of a scanning electron microscope (SEM) with a focused ion beam (FIB). This dual-beam system allows for high-resolution imaging, precise material removal, and deposition at the nanoscale, making it an indispensable tool in nanotechnology.
