In FIB-SEM, a focused beam of ions, usually
gallium ions, is directed at a sample to sputter material away. The SEM component then uses electrons to image the sample. The ion beam can be used to mill or cut the sample, while the electron beam provides high-resolution images. This combination allows for real-time observation of the material as it is being modified.
Applications in Nanotechnology
Advantages of FIB-SEM
FIB-SEM offers several advantages over traditional microscopy techniques:
Limitations and Challenges
Despite its many advantages, FIB-SEM also has some limitations:
Future Prospects
The future of FIB-SEM in nanotechnology looks promising with ongoing developments in
instrumentation and
methodologies. Innovations such as
cryogenic FIB-SEM and integration with other
analytical techniques are expanding its capabilities and applications. As technology advances, FIB-SEM will continue to play a crucial role in pushing the boundaries of nanotechnology research and application.
