What is Conductive Atomic Force Microscopy (c-AFM)?
Conductive Atomic Force Microscopy (c-AFM) is a specialized technique that combines the principles of Atomic Force Microscopy (AFM) with electrical conductivity measurements. It allows researchers to simultaneously obtain topographical and electrical information about a sample at the nanoscale. Using a conductive tip, c-AFM can measure the local current flow through a material, providing insights into its electrical properties.
