Attenuated Total Reflectance (ATR) is a sampling technique used in conjunction with infrared spectroscopy, particularly FTIR (Fourier Transform Infrared Spectroscopy). It enables the analysis of samples with minimal preparation, making it highly suitable for examining nanomaterials. ATR works by measuring the changes in an internally reflected infrared beam when it comes into contact with a sample. This interaction occurs at a specific interface, allowing for the collection of data on surface characteristics.
