How Is ATR Integrated with Other Techniques in Nanotechnology?
To overcome some of its limitations, ATR is often used in conjunction with other analytical techniques. For example, combining ATR with Scanning Electron Microscopy (SEM) or Atomic Force Microscopy (AFM) can provide complementary information on both surface morphology and chemical composition. This integrated approach enables researchers to gain a more comprehensive understanding of nanomaterial properties, aiding in the design and development of advanced nanotechnological applications.
