Despite their advantages, FIBs have some limitations:
Damage to Samples: The ion beam can cause damage to the sample, particularly in sensitive materials, leading to alterations in their properties. Slow Processing Speeds: FIB processes can be time-consuming, especially for large area modifications, limiting their throughput for certain applications. Cost: FIB systems are expensive to purchase and maintain, which may be prohibitive for some research institutions or smaller companies.
