What are the advantages of using Focused Ion Beams?
Focused Ion Beams offer several advantages in nanotechnology:
High Precision: FIBs can achieve nanometer-scale precision, making them ideal for applications requiring exact material manipulation. Versatility: FIB systems can perform multiple functions, including imaging, milling, and deposition, making them highly versatile tools for research and development. In-situ Analysis: FIBs can be integrated with other analytical techniques, such as scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS), allowing for real-time analysis during the modification process. Non-destructive Imaging: FIB imaging can be performed without significant damage to the sample, preserving its structural integrity for further analysis.
