What are the key challenges in measuring nanoscale properties?
One of the primary challenges in nanotechnology is accurately measuring properties at the nanoscale. Traditional measurement tools, such as optical microscopes, are not effective at this scale due to the diffraction limit of light. Advanced techniques like Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) are necessary but come with their own set of limitations including sample preparation, environmental conditions, and the potential for tip-induced artifacts.
