Aberrations can have significant consequences in nanotechnology applications:
Reduced Resolution: Aberrations can decrease the resolution of imaging systems, making it difficult to observe nanoscale features accurately. Inaccurate Measurements: Precision measurements, such as those required in nanometrology, can be compromised by aberrations. Performance Degradation: The performance of nanoscale devices, such as transistors and sensors, can be adversely affected. Increased Costs: Addressing and correcting aberrations can lead to increased costs in terms of time and resources.
